The role of SiO2 layer to stabilize the optical properties of p type Si-Nanocrystals grown by moderate etching current density
Crossref DOI link: https://doi.org/10.1007/s12633-022-02017-7
Published Online: 2022-07-21
Published Print: 2023-01
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Bechiri, F.
Djelloul, A.
Zerdali, M.
Text and Data Mining valid from 2022-07-21
Version of Record valid from 2022-07-21
Article History
Received: 14 March 2022
Accepted: 4 July 2022
First Online: 21 July 2022
Declarations
:
: Not applicable.
: The authors declare that they have no conflict of interest.