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Impact of Buried Gate Oxide on the Electrical Performance of Negative Capacitance FinFETs: Design Perspectives

Published Online: 2024-02-16

Published Print: 2024-05

Authors

Chauhan, Vibhuti

Samajdar, Dip Prakash
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Text and Data Mining valid from 2024-02-16

Version of Record valid from 2024-02-16
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Article History

Received: 28 August 2023

Accepted: 5 February 2024

First Online: 16 February 2024

Declarations

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: The authors declare no competing interests.

: All the authors contributed voluntarily to this work

: In accordance with the copyright transfer or open access rules.

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