A Theoretical Performance and Reliability Investigation of a Vertical Hetero Oxide Based JL-TFET under Ideal Conditions
Crossref DOI link: https://doi.org/10.1007/s12633-024-03010-y
Published Online: 2024-05-07
Published Print: 2024-07
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Chandan, Bandi Venkata
Dharmender,
Nigam, Kaushal
Text and Data Mining valid from 2024-05-07
Version of Record valid from 2024-05-07
Article History
Received: 30 November 2023
Accepted: 25 April 2024
First Online: 7 May 2024
Declarations
:
: No Competing of interests
: The manuscript follows all the ethical standards
: Yes