Impact of Process Variation on DC and Analog Characteristics of 2 nm Forksheet FET
Crossref DOI link: https://doi.org/10.1007/s12633-025-03273-z
Published Online: 2025-03-07
Published Print: 2025-04
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Kannam, Sai Lakshmi Prasanth
Shubham,
Pandey, Rajan Kumar
Text and Data Mining valid from 2025-03-07
Version of Record valid from 2025-03-07
Article History
Received: 10 September 2024
Accepted: 25 February 2025
First Online: 7 March 2025
Declarations
:
: The authors declare no competing interests.