Complex impedance, dielectric and modulus behavior of ZnO interlayered MOS device
Crossref DOI link: https://doi.org/10.1007/s12633-025-03545-8
Published Online: 2025-11-27
Published Print: 2026-01
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Acar, F. Z.
Ertuğrul Uyar, R.
Tataroğlu, A.
Text and Data Mining valid from 2025-11-27
Version of Record valid from 2025-11-27
Article History
Received: 18 June 2025
Accepted: 20 November 2025
First Online: 27 November 2025
Declarations
:
: The authors declare no competing interests.