Admittance and Dielectric Characteristics of Al/MgO/p-Si Device Produced By Spraying Method
Crossref DOI link: https://doi.org/10.1007/s12633-025-03547-6
Published Online: 2025-11-28
Published Print: 2026-01
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Güllü, Ö.
Türkeri, M.
Tataroğlu, A.
Text and Data Mining valid from 2025-11-28
Version of Record valid from 2025-11-28
Article History
Received: 26 June 2025
Accepted: 20 November 2025
First Online: 28 November 2025
Declarations
:
: The authors declare no competing interests.