Document is current

Any future updates will be listed below

Reliability-Oriented Design of Source-All-Around Vertical TFETs: Mitigation Strategies for Noise, Interface Traps, and Thermal Instability

Crossref DOI link: https://doi.org/10.1007/s12633-025-03592-1

Published Online: 2026-01-07

Published Print: 2026-02

Update policy: https://doi.org/10.1007/springer_crossmark_policy

About CrossMark