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Physical Insights into the Reliability of ES Fin-TFETs: An Analysis of Interface Traps, Noise, and Temperature-Induced Effects

Published Online: 2026-01-08

Published Print: 2026-02

Authors

Rao, B. V.

Sivadurgarao, Parasa

Kumar, Arun

Bhowmick, Brinda
Funding

Funding for this research was provided by:

ANRF (SRG/2023/001028)
License Information

Text and Data Mining valid from 2026-01-08

Version of Record valid from 2026-01-08
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Article History

Received: 30 July 2025

Accepted: 26 December 2025

First Online: 8 January 2026

Declarations

:

: The authors declare no competing interests.

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