Optical properties of electron beam evaporated ZrO2:10 %SiO2 thin films: dependence on structure
Crossref DOI link: https://doi.org/10.1007/s12648-016-0831-z
Published Online: 2016-02-08
Published Print: 2016-08
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Jena, S.
Tokas, R. B.
Thakur, S.
Sahoo, N. K.
Funding for this research was provided by:
Bhabha Atomic Research Centre (IN)
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