Laser induced Te diffusion in amorphous As50Se50 thin films probed by FTIR and XPS
Crossref DOI link: https://doi.org/10.1007/s12648-016-0954-2
Published Online: 2017-01-18
Published Print: 2017-05
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Behera, Mukta
Panda, Rozalin
Naik, Ramakanta
License valid from 2017-01-18
