Characterization by optical and magnetic spectroscopy of a synthesized SiO2 thin film used for radiation detector
Crossref DOI link: https://doi.org/10.1007/s12648-017-0998-y
Published Online: 2017-04-18
Published Print: 2017-09
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Abdelaziz, T. D.
Ezz-Eldin, F. M.
License valid from 2017-04-18