X-ray line-broadening study on sputtered InGaN semiconductor with evaluation of Williamson–Hall and size–strain plot methods
Crossref DOI link: https://doi.org/10.1007/s12648-019-01403-z
Published Online: 2019-03-09
Published Print: 2019-10
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Erdoğan, Erman http://orcid.org/0000-0003-2566-3284
Text and Data Mining valid from 2019-03-09
Article History
Received: 4 April 2018
Accepted: 17 December 2018
First Online: 9 March 2019