Bismuth thickness-dependent structural and electronic properties of Bi/As2Se3 bilayer thin films
Crossref DOI link: https://doi.org/10.1007/s12648-019-01484-w
Published Online: 2019-05-03
Published Print: 2020-04
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Behera, Mukta
Mishra, N. C.
Naik, Ramakanta
Funding for this research was provided by:
Inter University Accelerator Centre, New Delhi (IUAC/XIII.7/UFR-58306)
Text and Data Mining valid from 2019-05-03
Article History
Received: 6 September 2018
Accepted: 14 March 2019
First Online: 3 May 2019