Quantum scattering and its impact on the source–drain current with defect generation in the channel of nanoscale transistors
Crossref DOI link: https://doi.org/10.1007/s12648-019-01494-8
Published Online: 2019-05-21
Published Print: 2020-05
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Mao, Ling-Feng
Funding for this research was provided by:
National Natural Science Foundation of China (61774014)
Text and Data Mining valid from 2019-05-21
Version of Record valid from 2019-05-21
Article History
Received: 7 August 2018
Accepted: 28 March 2019
First Online: 21 May 2019