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Morphology study and threshold measurement of laser induced damage of nano-porous antireflective silica thin films in nano- and femtosecond pulse regimes

Crossref DOI link: https://doi.org/10.1007/s12648-020-01725-3

Published Online: 2020-03-18

Published Print: 2021-04

Update policy: https://doi.org/10.1007/springer_crossmark_policy

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