A new analytical approach to threshold voltage modeling of triple material gate-all-around heterojunction tunnel field effect transistor
Crossref DOI link: https://doi.org/10.1007/s12648-020-01792-6
Published Online: 2020-07-04
Published Print: 2021-07
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Usha, C. http://orcid.org/0000-0003-2035-7878
Vimala, P.
Text and Data Mining valid from 2020-07-04
Version of Record valid from 2020-07-04
Article History
Received: 27 August 2019
Accepted: 16 January 2020
First Online: 4 July 2020