Investigation of interface trap charges and temperature variation in heterostacked-TFET
Crossref DOI link: https://doi.org/10.1007/s12648-020-01834-z
Published Online: 2020-09-15
Published Print: 2021-09
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Vanlalawmpuia, K. http://orcid.org/0000-0001-5948-3236
Bhowmick, Brinda
Text and Data Mining valid from 2020-09-15
Version of Record valid from 2020-09-15
Article History
Received: 31 July 2019
Accepted: 6 March 2020
First Online: 15 September 2020