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Structural evolution and thickness-dependant optoelectronic properties in thermally evaporated silver telluride thin films

Crossref DOI link: https://doi.org/10.1007/s12648-022-02484-z

Published Online: 2022-12-25

Published Print: 2023-05

Update policy: https://doi.org/10.1007/springer_crossmark_policy

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