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Effect of frequency and temperature on dielectric properties of Au/SnO2/p-InP (MOS) capacitor

Crossref DOI link: https://doi.org/10.1007/s12648-025-03695-w

Published Online: 2025-07-09

Published Print: 2025-12

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Ertuğrul Uyar, Raziye https://orcid.org/0000-0001-5678-1051
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Text and Data Mining valid from 2025-07-09

Version of Record valid from 2025-07-09
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Article History

Received: 2 February 2025

Accepted: 25 June 2025

First Online: 9 July 2025

Declarations

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: There are no conflicts to declare.