Emissivity Model of Aluminum 7075 During the Growth of Oxide Layer Over the Temperature Range from 800 to 910 K at a Wavelength of 1.5 μm
Crossref DOI link: https://doi.org/10.1007/s12666-017-1239-y
Published Online: 2017-12-14
Published Print: 2018-05
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Shi, Deheng
Xing, Wei
Sun, Jinfeng
Zhu, Zunlue
Funding for this research was provided by:
National Natural Science Foundation of China (61077073)
National Natural Science Foundation of China (61177092)
License valid from 2017-12-14