A Novel Detection of Defects in Al–SiC Composite by Active Pulsed Infrared Thermography Using Data and Image Processing
Crossref DOI link: https://doi.org/10.1007/s12666-020-02074-9
Published Online: 2020-09-11
Published Print: 2020-11
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Singh, R. Ruban Blessed
Sasikumar, T.
Suresh, S.
Ramanan, G.
Text and Data Mining valid from 2020-09-11
Version of Record valid from 2020-09-11
Article History
Received: 8 April 2020
Accepted: 10 August 2020
First Online: 11 September 2020