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A Novel Methodology for Wettability Process Control of Buried Silicon Microchannels for Molecular Diagnostic Applications

Crossref DOI link: https://doi.org/10.1007/s12668-015-0173-x

Published Online: 2015-06-21

Published Print: 2015-09

Update policy: https://doi.org/10.1007/springer_crossmark_policy

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