Leveraging controllability measures for high transition delay test coverage in DTESFF based partial enhanced scan design
Crossref DOI link: https://doi.org/10.1007/s13198-020-00975-y
Published Online: 2020-05-02
Published Print: 2020-06
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Shrivastava, Vivek
Suhag, Ashok Kumar
Text and Data Mining valid from 2020-05-02
Version of Record valid from 2020-05-02
Article History
Received: 1 August 2019
Revised: 2 March 2020
First Online: 2 May 2020