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Wafer defect identification with optimal hyper-parameter tuning of support vector machine using the deep feature of ResNet 101

Published Online: 2023-12-26

Published Print: 2024-03

Authors

Behera, Santi Kumari

Dash, Shishir Prasad

Amat, Rajat

Sethy, Prabira Kumar https://orcid.org/0000-0003-3477-6715
License Information

Text and Data Mining valid from 2023-12-26

Version of Record valid from 2023-12-26
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Article History

Received: 6 April 2023

Revised: 9 October 2023

Accepted: 21 November 2023

First Online: 26 December 2023

Declarations

:

: The authors have no conflict of interest towards the publication of this research.

: In this research, there is no direct/indirect involvement of any human beings or animals<b>.</b>

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