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Resonant tunneling at electron field emission from Si tips coated with SiO2(Si) films

Crossref DOI link: https://doi.org/10.1007/s13204-018-0710-3

Published Online: 2018-03-12

Published Print: 2018-06

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Evtukh, A. A.

Pylypova, O. V. https://orcid.org/0000-0002-0337-4724
Martyniuk, O.

Mimura, H.
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Article History

Received: 28 December 2017

Accepted: 27 February 2018

First Online: 12 March 2018