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Fowler Nordheim Plot Analysis of Degradation in P3HT:PCBM Thin Film MIM Devices

Crossref DOI link: https://doi.org/10.1007/s13233-019-7135-z

Published Online: 2019-05-11

Published Print: 2019-10

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Singh, Vinamrita

Kumar, Ramesh
License Information

Text and Data Mining valid from 2019-05-11
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Article History

Received: 19 February 2019

Revised: 11 March 2019

Accepted: 11 March 2019

First Online: 11 May 2019