Systematic Temperature Effects in the Argon Cluster Ion Sputter Depth Profiling of Organic Materials Using Secondary Ion Mass Spectrometry
Crossref DOI link: https://doi.org/10.1007/s13361-016-1401-5
Published Online: 2016-04-22
Published Print: 2016-08-01
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Seah, Martin P.
Havelund, Rasmus
Gilmore, Ian S.
Funding for this research was provided by:
UK Department of Business, Innovation and Skills (3D nanoSIMS project)
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