Si<sub>1-<i>x</i></sub>Ge<sub><i>x</i></sub>/Si Interface Profiles Measured to Sub-Nanometer Precision Using uleSIMS Energy Sequencing
Crossref DOI link: https://doi.org/10.1007/s13361-016-1439-4
Published Online: 2016-07-21
Published Print: 2016-10-01
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Morris, R. J. H.
Hase, T. P. A.
Sanchez, A. M.
Rowlands, G.
License valid from 2016-07-21