Test Time Reduction in Automated Test Equipment (ATE)-Based Mechanism of Network-on-Chip Communication Infrastructure
Crossref DOI link: https://doi.org/10.1007/s13369-015-1803-x
Published Online: 2015-08-06
Published Print: 2015-11
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Soleymani, Mona
Reshadi, Midia
Text and Data Mining valid from 2015-08-06