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Defect Characterization in Cu2NiX (X = SSe, Te2, SeTe) Chalcogenide Semiconductors Using Positron Annihilation Spectroscopy

Crossref DOI link: https://doi.org/10.1007/s13369-025-10262-2

Published Online: 2025-05-30

Published Print: 2026-01

Update policy: https://doi.org/10.1007/springer_crossmark_policy

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