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Hybrid Wafer Defect Detection and Segmentation Using Verilog-Based Image Preprocessing and Deep Learning Architectures

Published Online: 2025-11-25

Authors

Naik, Bukke Chandrababu

Sevagan, S.

Kamalakannan, Bharath

Derllinraj, N.

Gopi, Varun P.
License Information

Text and Data Mining valid from 2025-11-25

Version of Record valid from 2025-11-25
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Article History

Received: 1 July 2025

Accepted: 10 November 2025

First Online: 25 November 2025

Declarations

:

: The authors declare that they have no identifiable conflict of interest or personal ties that could have potentially influenced the work and findings presented in this publication.

: This article does not include any research that involved the use of human subjects or animals.

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