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Correlation of reverse leakage current conduction mechanism and electrostatic discharge robustness of transient voltage suppression diode

Crossref DOI link: https://doi.org/10.1007/s13391-014-3296-2

Published Online: 2014-09-10

Published Print: 2014-09

Update policy: https://doi.org/10.1007/springer_crossmark_policy

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