Strong correlation between capacitance and breakdown voltage of GaInN/GaN light-emitting diodes
Crossref DOI link: https://doi.org/10.1007/s13391-014-4008-7
Published Online: 2014-11-10
Published Print: 2014-11
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Cho, Jaehee
Schubert, E. F.
Son, Joong Kon
Kim, Dong Yeong
Kim, Jong Kyu
Text and Data Mining valid from 2014-11-01