Effect of post-deposition annealing on the structural, optical and electrical properties of IGZO films
Crossref DOI link: https://doi.org/10.1007/s13391-014-4410-1
Published Online: 2015-05-10
Published Print: 2015-05
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Jeon, Jae-Hyun
Gong, Tae-Kyung
Kong, Young-Min
Lee, Hak Min
Kim, Daeil
Text and Data Mining valid from 2015-05-01