Stability study of solution-processed zinc tin oxide thin-film transistors
Crossref DOI link: https://doi.org/10.1007/s13391-015-5209-4
Published Online: 2015-10-28
Published Print: 2015-11
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Zhang, Xue
Ndabakuranye, Jean Pierre
Kim, Dong Wook
Choi, Jong Sun
Park, Jaehoon
Text and Data Mining valid from 2015-10-28