The influence of hydrogenation on the electrical properties of impurity-contaminated silicon grain boundaries
Crossref DOI link: https://doi.org/10.1007/s13391-015-5214-7
Published Online: 2015-10-28
Published Print: 2015-11
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Park, Yongkook
Lu, Jinggang
Park, Jin-Hong
Rozgonyi, George
Text and Data Mining valid from 2015-10-28