Improvement of minority carrier life time in N-type monocrystalline Si by the Czochralski method
Crossref DOI link: https://doi.org/10.1007/s13391-016-4001-4
Published Online: 2016-07-10
Published Print: 2016-07
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Baik, Sungsun
Pang, Ilsun
Kim, Jaemin
Kim, Kwanghun
License valid from 2016-07-01