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An Alternative X-ray Diffraction Analysis for Comprehensive Determination of Structural Properties in Compositionally Graded Strained AlGaN Epilayers

Crossref DOI link: https://doi.org/10.1007/s13391-018-0074-6

Published Online: 2018-05-31

Published Print: 2018-11

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Das, Palash https://orcid.org/0000-0002-2643-3563
Jana, Sanjay Kumar

Halder, Nripendra N.

Mallik, S.

Mahato, S. S.

Panda, A. K.

Chow, Peter P.

Biswas, Dhrubes
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Text and Data Mining valid from 2018-05-31
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Article History

Received: 12 July 2017

Accepted: 12 April 2018

First Online: 31 May 2018