Growth and Characterization of High-Quality Dielectric Sputtered Zinc Oxide Films from the First Principle
Crossref DOI link: https://doi.org/10.1007/s13538-014-0251-5
Published Online: 2014-08-20
Published Print: 2014-12
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Kurhekar, Anil
Apte, Prakash R.
Duttagupta, Siddharth
Text and Data Mining valid from 2014-08-20