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Reinforcing the Structural, Dielectric, Conductivity, and Linear/Nonlinear Optical Properties of PS-Bi2O3-SiO2 Nanostructures for Radiation Protection and Optoelectronic Applications

Crossref DOI link: https://doi.org/10.1007/s13538-025-01902-x

Published Online: 2025-09-15

Published Print: 2025-12

Update policy: https://doi.org/10.1007/springer_crossmark_policy

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