A Novel Method for Specimen Preparation and Analysis of CVD Diamond Coated Tools Using Focussed Ion Beams (FIB) and Scanning Electron Microscopy (SEM)
Crossref DOI link: https://doi.org/10.1007/s13632-014-0184-y
Published Online: 2015-01-21
Published Print: 2015-02
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Berger, D.
Uhlmann, E.
Dethlefs, I.
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