Thin film deposition from dual ion beam sputtering system
Crossref DOI link: https://doi.org/10.1007/s40012-019-00253-8
Published Online: 2019-06-04
Published Print: 2019-06
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Mukherjee, Shaibal https://orcid.org/0000-0002-9879-7278
Funding for this research was provided by:
Ministry of Electronics and Information technology (YFRF)
Text and Data Mining valid from 2019-06-01
Version of Record valid from 2019-06-01
Article History
Received: 28 November 2018
Accepted: 30 May 2019
First Online: 4 June 2019