Improvement of Drive Currents of FinFET using Strained Si Technology
Crossref DOI link: https://doi.org/10.1007/s40031-021-00641-2
Published Online: 2021-07-20
Published Print: 2022-02
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Das, Supratim Subhra
Text and Data Mining valid from 2021-07-20
Version of Record valid from 2021-07-20
Article History
Received: 26 June 2018
Accepted: 16 February 2021
First Online: 20 July 2021
Compliance with ethical standards
:
: The authors declare that they have no conflict of interests.