Assessment of Effective Wavelet Filters for Measuring Surface Roughness Using Image Processing
Crossref DOI link: https://doi.org/10.1007/s40032-025-01298-2
Published Online: 2025-11-28
Published Print: 2026-02
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Fahad, S. Mohamed
Jailani, H. Siddhi https://orcid.org/0000-0002-5946-7372
Ali, J. Mahashar
Text and Data Mining valid from 2025-11-28
Version of Record valid from 2025-11-28
Article History
Received: 3 June 2025
Accepted: 16 November 2025
First Online: 28 November 2025
Declarations
:
: Not applicable.
: The authors declare no conflicts of interest.