In-situ scanning tunneling microscopy observation of thickness-dependent air-sensitive layered materials and heterodevices
Crossref DOI link: https://doi.org/10.1007/s40042-022-00692-8
Published Online: 2023-01-03
Published Print: 2023-01
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Kim, Hyoung Kug
Kim, Dowook
Lee, Dong Guk
Ahn, Eun-Su
Jeong, Hyeon-Woo
Lee, Gil-Ho
Kim, Jun Sung
Kim, Tae-Hwan
Text and Data Mining valid from 2023-01-01
Version of Record valid from 2023-01-01
Article History
Received: 24 November 2022
Revised: 5 December 2022
Accepted: 6 December 2022
First Online: 3 January 2023