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Analysis of Fermi level pinning characteristics in erbium silicided metal–semiconductor interface

Crossref DOI link: https://doi.org/10.1007/s40042-024-01178-5

Published Online: 2024-09-25

Published Print: 2024-11

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Kim, Seok-kyu https://orcid.org/0009-0005-0598-0997
Jeong, Soyeon https://orcid.org/0009-0006-8615-8977
Kim, Jaemin https://orcid.org/0009-0005-4889-1791
Jang, Moongyu https://orcid.org/0000-0003-4019-2564
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Text and Data Mining valid from 2024-09-25

Version of Record valid from 2024-09-25
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Article History

Received: 14 August 2024

Revised: 2 September 2024

Accepted: 2 September 2024

First Online: 25 September 2024