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Electric-field-driven subsurface atomic migration in van der Waals bilayer $$\textrm{Ta}_{2}\textrm{NiSe}_{5}$$ via scanning tunneling microscopy

Crossref DOI link: https://doi.org/10.1007/s40042-025-01428-0

Published Online: 2025-07-01

Published Print: 2025-08

Update policy: https://doi.org/10.1007/springer_crossmark_policy

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