Structural and optical characterization of ZrO2 thin films grown on silicon and quartz substrates
Crossref DOI link: https://doi.org/10.1007/s40094-016-0218-8
Published Online: 2016-04-16
Published Print: 2016-09
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Hojabri, Alireza
License valid from 2016-04-16