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Computer Vision and Machine Learning Techniques for Optical Micrograph Defect Classification Using a Novel Gray Thresholding Technique

Published Online: 2026-08-13

Authors

Hasbrouck, C. R. https://orcid.org/0000-0002-7467-8637
Miller, Simon W.

Martin, Jay
Funding

Funding for this research was provided by:

Defense Threat Reduction Agency (N000024-18-D-6401)
License Information

Text and Data Mining valid from 2026-08-13

Version of Record valid from 2026-08-13
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Article History

Received: 26 February 2026

Accepted: 16 July 2026

First Online: 13 August 2026

Declarations

Conflict of interest: On behalf of all authors, the corresponding author states that there is no conflict of interest.

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