Thermal Conductivity Degradation and Microstructural Damage Characterization in Low-Dose Ion Beam-Irradiated 3C-SiC
Crossref DOI link: https://doi.org/10.1007/s40553-017-0107-3
Published Online: 2017-04-18
Published Print: 2017-12
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Chauhan, Vinay S.
Riyad, M. Faisal
Du, Xinpeng
Wei, Changdong
Tyburska-PĆ¼schel, Beata
Zhao, Ji-Cheng
Khafizov, Marat
License valid from 2017-04-18